Zuken® and XJTAG®, a leader in boundary scan and design for test technology, have released a plugin that will enhance Zuken’s CR-8000 with a design for test (DFT) capability improving test coverage by allowing additional design checks during schematic entry. The capability is based on XJTAG’s DFT Assistant and will be released as a free plugin for Zuken’s CR-8000 Design Gateway users at Embedded World 2018 in Nuremberg, Germany.
