In Conversation: Nuclear Fusion
In this insightful conversation, Colin Robertson, our Sales Director, discusses the recent emergence of nuclear fusion research and how Hiden Analytical’s instrumentation supports fusion research, from tritium breeding to isotope recycling and long-pulse operation. Read more [Picture source: Hiden Analytical on linkedin.com]
Revolutionising Solar Energy: New Flexible Solar Cell Technology with High Dynamic Range and Precision Depth Profiling
Hiden Analytical, a leading innovator in materials and gas analysis, is proud to announce an important development of the SIMS Workstation family of instruments, the Dual Polarity Simultaneous Detector. Read more
SIMS Surface Analysis for Battery Cathode-Electrolyte Interfaces: Depth Profiling of SEI Composition
The stability and lifetime of lithium-ion batteries hinges on deciphering the reactive processes that occur where the cathode meets the electrolyte. During cycling, electrolyte components oxidise at the cathode-electrolyte interface and form a thin, reactive interphase. This layer is commonly known as the solid electrolyte interphase (SEI), or more specifically as the cathode-electrolyte interphase (CEI) when…
Exploring Near Atmospheric XPS (APXPS): Bringing Surface Analysis Closer to Real-World Conditions
Traditional X-ray Photoelectron Spectroscopy (XPS) is a cornerstone technique for investigating the surface chemistry of materials. However, conventional XPS systems operate under ultra-high vacuum (UHV) conditions — a controlled environment necessary for accurate measurements, but far removed from the pressures and reactive conditions most materials experience in real-world applications. Read more
Massoft 11: the pinnacle of mass spectrometry software innovation
Hiden Analytical Ltd. proudly presents MASsoft 11, the latest evolution of our premier mass spectrometry software. Representing a significant advancement in analytical technology, MASsoft 11 combines powerful performance enhancements with a suite of intuitive tools designed to meet the demanding needs of today’s scientific professionals. Read more
Explore the ECL Series in Detail — New Brochure Now Available from Hiden Analytical
Following the successful launch of the ECL Series, Hiden Analytical is pleased to announce the release of a new brochure offering an in-depth look at the design, features, and applications of this versatile electrochemical toolkit. Designed to work seamlessly with the HPR-40 DEMS, the ECL Series transforms electrochemical research by providing real-time analysis of gases and…
Watching Solid-State Sodium Batteries Fail – In Real Time
Why do some of the most promising next-generation batteries fail—and how can we stop it? A new peer-reviewed study led by Imperial College London answers that by watching the failure process unfold as the battery operates. Using simultaneous dual-polarity secondary-ion mass spectrometry (SIMS) alongside controlled electrochemical cycling, the team directly observed where, when, and why degradation…
Hiden Analytical Launches the ECL Series – A New Toolkit for Electrochemical Discovery
Hiden Analytical is proud to announce the launch of the ECL Series — a new range of versatile electrochemical accessories for the HPR-40 DEMS, making a turnkey system for the real-time analysis of gases and volatile species in electrochemical research, empowering researchers with new levels of flexibility and precision. Read more
Key Applications & Benefits of SIMS-Based End Point Detectors
Advanced semiconductor manufacturing necessitates control at every stage of the fabrication process, with etch processes being among the most critical to perform with precision. Even a microscopic deviation at a material interface can impact device performance, yield, and long-term reliability. Secondary Ion Mass Spectrometry (SIMS)-based end point detection has emerged as a dependable way to determine…
Optimising Thin Film End Point “Recipes” Through Data Replay
Timing is everything in thin film etching. Having the process halt at the right moment is critical to protecting underlying layers, maintaining uniformity, and maximising yield. This level of control hinges on thin film end point recipes, logical frameworks that interpret real-time secondary ion mass spectrometry signals to detect when a target layer has been removed….