Mitutoyo RCE demonstrated their digital holography sensor model
December 3rd and 4th during the open house days in Veenendaal, Mitutoyo RCE demonstrated their digital holography sensor model. Access to the demo room was by invitation only. Visitors from market leaders from semiconductor, photonics and nano technology industry…
Mitutoyo + Perspectief: Driving Innovation in the Future of Optics
Proud to share that NWO has awarded funding to twelve new Perspectief research programmes, supporting major technological innovations across key domains such as semiconductors, nanotechnology, water, food production, and medical technology. Read more [Picture source: Mitutoyo Research Center Europe on linkedin.com]
In Formula 1, 0.07 millimetres can be the difference between winning and losing
This weekend once again highlighted how extremely small the margins are at the very top of motorsport. The FIA measures the thickness of the car’s skid plank with Mitutoyo’s Micrometre, accurate to thousands of a millimetre — because even minimal wear can directly determine whether a race result stands. Read more
Moving into the nano world with metrology
Last week at the EPIC Conference in Munich (17 November), Fulco Verheul presented “Moving into the nano world with metrology”. In a room filled with photonics experts and industry leaders, he highlighted Mitutoyo’s nearly 100-year metrology legacy and how we are evolving to address the technological challenges of tomorrow. Read more [Picture…
Mitutoyo Research Center Europa (RCE) – Nieuw lid van DutchHTS
Mitutoyo is wereldwijd een toonaangevende speler in hoogprecisie metrologie. Het Research Center Europa (RCE), gevestigd in Best, maakt deel uit van de internationale R&D-organisatie van Mitutoyo en richt zich op toegepast onderzoek binnen metrologie. Lees verder
New Release: Dimensional Metrology
We are proud to share that ‘our’ Han Haitjema has authored the book Dimensional Metrology.
In this work, he brings the world of precision measurement to life: from the mathematical principles behind measurements to practical applications in high-tech industries and research. Read more [Picture source: Mitutoyo Research Center Europe on linkedin.com]