Mitutoyo RCE demonstrated their digital holography sensor model

December 3rd and 4th during the open house days in Veenendaal, Mitutoyo RCE demonstrated their digital holography sensor model. Access to the demo room was by invitation only. Visitors from market leaders from semiconductor, photonics and nano technology industry…

Mitutoyo + Perspectief: Driving Innovation in the Future of Optics

Proud to share that NWO has awarded funding to twelve new Perspectief research programmes, supporting major technological innovations across key domains such as semiconductors, nanotechnology, water, food production, and medical technology. Read more [Picture source: Mitutoyo Research Center Europe on linkedin.com]

Moving into the nano world with metrology

Last week at the EPIC Conference in Munich (17 November), Fulco Verheul presented “Moving into the nano world with metrology”. In a room filled with photonics experts and industry leaders, he highlighted Mitutoyo’s nearly 100-year metrology legacy and how we are evolving to address the technological challenges of tomorrow. Read more [Picture…

New Release: Dimensional Metrology

We are proud to share that ‘our’ Han Haitjema has authored the book Dimensional Metrology.

In this work, he brings the world of precision measurement to life: from the mathematical principles behind measurements to practical applications in high-tech industries and research. Read more [Picture source: Mitutoyo Research Center Europe on linkedin.com]